BMF-BD: Bayesian model fusion on Bernoulli distribution for efficient yield estimation of integrated circuits
Published in In the proceedings of Proceedings of the 51st Annual Design Automation Conference, 2014
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Recommended citation: Chenlei Fang, Fan Yang, Xuan Zeng, Xin Li, "BMF-BD: Bayesian model fusion on Bernoulli distribution for efficient yield estimation of integrated circuits." In the proceedings of Proceedings of the 51st Annual Design Automation Conference, 2014.