Bayesian methods for the yield optimization of analog and SRAM circuits
Published in In the proceedings of 2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC), 2020
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Recommended citation: Shuhan Zhang, Fan Yang, Dian Zhou, Xuan Zeng, "Bayesian methods for the yield optimization of analog and SRAM circuits." In the proceedings of 2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC), 2020.