Hotspot detection via attention-based deep layout metric learning
Published in In the proceedings of Proceedings of the 39th International Conference on Computer-Aided Design, 2020
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Recommended citation: Hao Geng, Haoyu Yang, Lu Zhang, Jin Miao, Fan Yang, Xuan Zeng, Bei Yu, "Hotspot detection via attention-based deep layout metric learning." In the proceedings of Proceedings of the 39th International Conference on Computer-Aided Design, 2020.