Adversarial Sample Generation for Lithography Hotspot Detection
Published in In the proceedings of 2022 IEEE International Symposium on Circuits and Systems (ISCAS), 2022
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Recommended citation: Shuyuan Sun, Yiyang Jiang, Fan Yang, Xuan Zeng, "Adversarial Sample Generation for Lithography Hotspot Detection." In the proceedings of 2022 IEEE International Symposium on Circuits and Systems (ISCAS), 2022.