Yield Optimization for Analog Circuits over Multiple Corners via Bayesian Neural Networks: Enhancing Circuit Reliability under Environmental Variation
Published in ACM Transactions on Design Automation of Electronic Systems, 2023
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Recommended citation: Nanlin Guo, Fulin Peng, Jiahe Shi, Fan Yang, Jun Tao, Xuan Zeng, "Yield Optimization for Analog Circuits over Multiple Corners via Bayesian Neural Networks: Enhancing Circuit Reliability under Environmental Variation." ACM Transactions on Design Automation of Electronic Systems, 2023.